Experts provide a tour of academic and industrial use cases in Materials Science, Engineering and Life Science.
X-ray computed tomography (CT) is becoming an increasingly important tool for the non-destructive characterization and inspection of the three-dimensional microstructure of various materials, products and sample types. The technique creates a three-dimensional representation of a sample/material by reconstructing cross-sectional images or ‘virtual slices’ through a sample.
In this webinar, Robert Williams, PhD, and Mark Riccio highlight the versatility of the Thermo Scientific™ HeliScan™ microCT, demonstrating the wide breadth of sample types and sizes that the instrument can characterize, such as: polymers, metals, manufactured parts, batteries, rock/porous media, electronics, bone and soft tissue (plants, insects, brain, etc). The HeliScan™ microCT creates valuable solutions by leveraging a helical scanning technique (found in clinical CT scanners) for large volume data acquisition and features a Lab6 X-ray filament for high resolution (400nm) capability.
The ease of use and high throughput of this system makes it ideal for investigations that need to identify and quantify a sample’s 3D internal structure (e.g. voids, cracks, pore networks, coatings, etc.) non-destructively. 4D structural dynamics can be studied by acquiring multiple 3D microCT datasets. Additionally, HeliScan™ microCT is an integral component of a multi-modal macro-scale to atomic-scale workflow involving focused ion beam/scanning electron microscopes and transmission electron (TEM) microscopes.
Key Topics Include:
- Demonstrate the versatility of the HeliScan™ microCT for analyzing samples/materials from dense steels to battery components to low density polymers and life science samples.
- Reveal how to obtain insights into the microstructure of large volumes of a wide variety of materials at high resolution.
- Show a multiscale, multi-modal workflow from microCT to focused ion beam/scanning electron microscopes (FIB-SEM) to atomic-scale analysis in a transmission electron microscope (TEM).
Resources
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Presenters
Assistant Director for Research and Development
Center of Electron Microscopy and Analysis
The Ohio State University
Product Marketing Manager
Materials & Structural Analysis Division
Thermo Fisher Scientific
Production Partner
Thermo Fisher Scientific
